X-ray diffraction (Model: Bruker D8 advance)

The high-speed energy-dispersive LYNXEYE XE-T detector uniquely combines fast data collection with unprecedented filtering of fluorescence and Kβ radiation. Its proprietary Variable Active Detector Window and the Motorized Anti-Scatter Screen (MASS) enable data collection from lowest 2Th angles without parasitic low-angle background scattering, in particular air scattering. The fully automated MASS retraction avoids beam cropping, even in combination with continuously variable slits that provide superb counting statistics over the whole angular range. Superb counting statistics allows for faster data collection and increased sample throughput No parasitic low-angle background scattering massively improves data quality of pharma, clay, zeolite and other samples having a large unit cell Best peak-to-background enhances sensitivity for minor phases. The high-speed energy-dispersive LYNXEYE XE-T detector uniquely combines fast data collection with unprecedented filtering of fluorescence and Kβ radiation. Its proprietary Variable Active Detector Window and the Motorized Anti-Scatter Screen (MASS) enable data collection from lowest 2Th angles without parasitic low-angle background scattering, in particular air scattering. The fully automated MASS retraction avoids beam cropping, even in combination with continuously variable slits that provide superb counting statistics over the whole angular range. Superb counting statistics allows for faster data collection and increased sample throughput No parasitic low-angle background scattering massively improves data quality of pharma, clay, zeolite and other samples having a large unit cell Best peak-to-background enhances sensitivity for minor phases.

The TRIO™ optic is the key component of the D8 ADVANCE Plus, meeting the specific demands on the instrument resolution of the three most commonly used X-ray diffraction geometries in one single optic

• Divergent beam for conventional powder diffraction (XRPD)
• High intensity parallel beam for capillary experiments, height insensitive measurements, surface sensitive grazing
• Pure Cu-Kα1 parallel beam for high-resolution diffraction (HRXRD) of epitaxial thin films and low symmetry powder samples
• incidence geometry (GID), coating thickness determination (XRR) and micro-diffraction (μXRD)

Charges

• Rs (Per Sample): 300/-